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| TC74HC595AP/AF/AFN TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC74HC595AP,TC74HC595AF,TC74HC595AFN 8-Bit Shift Register/Latch (3-state) The TC74HC595A is a high speed 8-BIT SHIFT REGISTER/LATCH fabricated with silicon gate C2MOS technology. It achieve the high speed operation similar to equivalent LSTTL while maintaining the CMOS low power dissipation. The TC74HC595A contains an 8-bit static shift register which feeds an 8-bit storage register. Shift operation is accomplished on the positive going transition of the SCK input. The output register is loaded with the contents of the shift register on the positive going transition of the RCK input. Since RCK and SCK signal are independent, parallel outputs can be held stable during the shift operation. And, since the parallel outputs are 3-state, it can be directly connected to 8-bit bus. This register can be used in serial-to-parallel conversion, data receivers, etc. All inputs are equipped with protection circuits against static discharge or transient excess voltage. Note: xxxFN (JEDEC SOP) is not available in Japan. TC74HC595AP TC74HC595AF Features * * * * * High speed: fmax = 55 MHz (typ.) at VCC = 5 V Low power dissipation: ICC = 4 A (max) at Ta = 25C High noise immunity: VNIH = VNIL = 28% VCC (min) Output drive capability: 15 LSTTL loads for QA to QH 10 LSTTL loads for QH' Symmetrical output impedance: |IOH| = IOL = 6 mA (min) For QA to QH |IOH| = IOL = 4 mA (min) For QH' Balanced propagation delays: tpLH - tpHL Wide operating voltage range: VCC (opr) = 2 to 6 V Pin and function compatible with 74LS595 TC74HC595AFN * * * Weight DIP16-P-300-2.54A SOP16-P-300-1.27A SOL16-P-150-1.27 : 1.00 g (typ.) : 0.18 g (typ.) : 0.13 g (typ.) Pin Assignment 1 2007-10-01 TC74HC595AP/AF/AFN IEC Logic Symbol Truth Table Inputs SI SCK SCLR X X L H H H RCK X X X X X X G H L X X X X X X QA thru QH outputs disable QA thru QH outputs enable Shift register is cleared. Function X X X L H X X X X X X First stage of S.R. becomes "L". Other stages store the data of previous stage, respectively. First stage of S.R. becomes "H". Other stages store the data of previous stage, respectively. State of S.R. is not changed. S.R. data is stored into storage register. Storage register stage is not changed. X X X X X: Don't care 2 2007-10-01 TC74HC595AP/AF/AFN Timing Chart 3 2007-10-01 TC74HC595AP/AF/AFN System Diagram Absolute Maximum Ratings (Note 1) Characteristics Supply voltage range DC input voltage DC output voltage Input diode current Output diode current DC output current (QH') (QA to QH) DC VCC/ground current Power dissipation Storage temperature Symbol VCC VIN VOUT IIK IOK IOUT ICC PD Tstg Rating -0.5 to 7 -0.5 to VCC + 0.5 -0.5 to VCC + 0.5 20 20 25 35 75 Unit V V V mA mA mA mA mW C 500 (DIP) (Note 2)/180 (SOP) -65 to 150 Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 2: 500 mW in the range of Ta = -40 to 65C. From Ta = 65 to 85C a derating factor of -10 mW/C shall be applied until 300 mW. 4 2007-10-01 TC74HC595AP/AF/AFN Operating Ranges (Note) Characteristics Supply voltage Input voltage Output voltage Operating temperature Symbol VCC VIN VOUT Topr Rating 2 to 6 0 to VCC 0 to VCC -40 to 85 Unit V V V C 0 to 1000 (VCC = 2.0 V) Input rise and fall time tr, tf 0 to 500 (VCC = 4.5 V) 0 to 400 (VCC = 6.0 V) ns Note: The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VCC or GND. Electrical Characteristics DC Characteristics Characteristics Symbol Test Condition VCC (V) 2.0 High-level input voltage VIH Ta = 25C Min 1.50 3.15 4.20 Ta = -40 to 85C Max Unit Typ. Min 1.50 3.15 4.20 Max 4.5 6.0 2.0 V 0.50 1.35 1.80 0.50 1.35 1.80 Low-level input voltage VIL 4.5 6.0 2.0 V 1.9 4.4 5.9 4.18 5.68 4.18 5.68 2.0 4.5 6.0 4.31 5.80 4.31 5.80 0.0 0.0 0.0 0.17 0.18 0.17 0.18 1.9 4.4 5.9 4.13 5.63 4.13 5.63 VIN I = -20 A = VIH or VIL OH High-level output voltage VOH IOH = -4 mA IOH = -5.2 mA IOH = -6 mA IOH = -7.8 mA 4.5 6.0 V QH' QA to QH 4.5 6.0 4.5 6.0 2.0 V 0.1 0.1 0.1 0.26 0.26 0.26 0.26 0.5 0.1 0.1 0.1 0.1 0.33 0.33 0.33 0.33 5.0 1.0 A A A VIN I = 20 A = VIH or VIL OL Low-level output voltage VOL IOL = 4 mA IOL = 5.2 mA IOL = 6 mA IOL = 7.8 mA 4.5 6.0 V QH' QA to QH 4.5 6.0 4.5 6.0 6.0 6.0 6.0 V 3-state output off-state current Input leakage current Quiescent supply current IOZ IIN ICC VIN = VIH or VIL VOUT = VCC or GND VIN = VCC or GND VIN = VCC or GND 4.0 40.0 5 2007-10-01 TC74HC595AP/AF/AFN Timing Requirements (input: tr = tf = 6 ns) Characteristics Symbol Test Condition VCC (V) Minimum pulse width (SCK, RCK) tW (H) tW (L) 2.0 Ta = 25C Typ. Ta = -40 to 85C Limit 95 19 16 95 19 16 65 13 11 95 19 16 125 25 21 0 0 0 65 13 11 5 25 28 Unit Limit 75 15 13 75 15 13 50 10 9 75 15 13 100 20 17 0 0 0 50 10 9 6 30 35 4.5 6.0 2.0 ns Minimum pulse width ( SCLR ) tW (L) 4.5 6.0 2.0 ns Minimum set-up time (SI-SCK) ts 4.5 6.0 2.0 ns Minimum set-up time (SCK-RCK) ts 4.5 6.0 2.0 ns Minimum set-up time ( SCLR -RCK) ts 4.5 6.0 2.0 ns Minimum hold time th 4.5 6.0 ns Minimum removal time ( SCLR ) 2.0 trem 4.5 6.0 2.0 ns Clock frequency f 4.5 6.0 MHz AC Characteristics (CL = 15 pF, VCC = 5 V, Ta = 25C, input: tr = tf = 6 ns) Characteristics Output transition time (QH') Propagation delay time (SCK-QH') Propagation delay time ( SCLR -QH') Maximum clock frequency Symbol tTLH tTHL tpLH tpHL tpHL fmax Test Condition Min Typ. 4 Max 8 Unit ns 12 21 ns 15 77 30 ns MHz 35 6 2007-10-01 TC74HC595AP/AF/AFN AC Characteristics (input: tr = tf = 6 ns) Characteristics Symbol Test Condition CL (pF) VCC (V) Output transition time (Qn) tTLH tTHL 2.0 Ta = 25C Min Ta = -40 to 85C Max 60 12 10 75 15 13 125 25 21 175 35 30 150 30 26 190 38 32 135 27 23 175 35 30 150 30 26 Unit Typ. 25 7 6 30 8 7 45 15 13 60 18 15 60 20 17 75 25 22 45 15 13 60 20 17 30 15 14 17 50 59 5 184 Min Max 75 15 13 95 19 16 155 31 26 220 44 37 190 38 32 240 48 41 170 34 29 220 44 37 190 38 33 50 4.5 6.0 2.0 ns Output transition time (QH') Propagation delay time (SCK-QH') Propagation delay time ( SCLR -QH') tTLH tTHL 50 4.5 6.0 2.0 ns tpLH tpHL 50 4.5 6.0 2.0 ns tpHL 50 4.5 6.0 2.0 ns 50 Propagation delay time (RCK-Qn) tpLH tpHL 4.5 6.0 2.0 ns 150 4.5 6.0 2.0 50 Output enable time tpZL tpZH RL = 1 k 150 4.5 6.0 2.0 4.5 6.0 ns Output disable time tpLZ tpHZ 2.0 RL = 1 k 50 4.5 6.0 2.0 ns 6 30 35 5 25 28 Maximum clock frequency Input capacitance Power dissipation capacitance fmax 50 4.5 6.0 MHz CIN CPD (Note) 10 10 pF pF Note: CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load. Average operating current can be obtained by the equation: ICC (opr) = CPDVCCfIN + ICC 7 2007-10-01 TC74HC595AP/AF/AFN Package Dimensions Weight: 1.00 g (typ.) 8 2007-10-01 TC74HC595AP/AF/AFN Package Dimensions Weight: 0.18 g (typ.) 9 2007-10-01 TC74HC595AP/AF/AFN Package Dimensions (Note) Note: This package is not available in Japan. Weight: 0.13 g (typ.) 10 2007-10-01 TC74HC595AP/AF/AFN RESTRICTIONS ON PRODUCT USE * The information contained herein is subject to change without notice. 20070701-EN GENERAL * TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer's own risk. * The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. * Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 11 2007-10-01 |
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